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Applied logistic regression. Jr., David W. Lemeshow, Stanley Hosmer

By: Material type: TextTextPublication details: Canada : Jhn Wiley & Sons, Inc., 1989Description: p. cm. (Wiley series in probability and mathematical statistics. Applied probability and statistics section)ISBN:
  • 0-471-61553-6
  • 978-0-471-61553-8
Subject(s):
Holdings
Item type Current library Collection Call number Status Date due Barcode
Book Book Research Library Stacks Non-fiction QA 278.2 .H67 1989 (Browse shelf(Opens below)) Available 716

A Wiley-Interscience publication. Bibliography : p.

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