Applied logistic regression. Jr., David W. Lemeshow, Stanley Hosmer

By:

Hosmer, Jr., David W. Lemeshow, Stanley

Material type: Text

TextPublication details: Canada : Jhn Wiley & Sons, Inc., 1989Description: p. cm. (Wiley series in probability and mathematical statistics. Applied probability and statistics section)ISBN:

0-471-61553-6
978-0-471-61553-8

Subject(s):

Regression analysis. Lemeshow, Stanley. Title. Series
Regression analysis. Lemeshow, Stanley. Title. Series

Holdings ( 1 )
Title notes ( 1 )

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Book	Research Library Stacks	Non-fiction	QA 278.2 .H67 1989 (Browse shelf(Opens below))	Available		716

A Wiley-Interscience publication. Bibliography : p.

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